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Analytical Metrology Handbook

 

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This document ($25 USD) is intended as a quick-reference handbook of topics in  measurement uncertainty analysis, measurement decision risk analysis, calibration interval analysis and measurement process control.  This handbook is a must for anyone that makes measurements or manages measurement technology.

 

 
    Table of Contents

  • Foreword

  • Table of Contents

  • Acronyms

  • Part 1 - Facts and Fallacies

  • Part 2 - Estimating Measurement Uncertainty

  • Part 3 - Analyzing Measurement Decision Risk

  • Part 4 - Analyzing Calibration Intervals

  • Part 5 - Controlling Measurement Processes

  • References and Suggested Reading

 

Part 1 - Facts and Fallacies

Part 1 addresses current facts and fictions relating to uncertainty analysis, risk analysis, interval analysis and SPC for measurement processes.

 
 

Part 2 - Estimating Measurement Uncertainty

This part of the handbook discusses various motivations for estimating measurement uncertainty.  Methods for estimating uncertainty are described and a systematic procedure for analyzing measurement uncertainty is presented.  Part 2 concludes with a discussion of the various uses for uncertainty estimates.   Subtopics are listed below.

 
 

Why Estimate Uncertainty?

Uncertainty Analysis Fundamentals

Estimating Uncertainty

The General Uncertainty Analysis Process

   Expanded Uncertainty

   Reporting Uncertainty

   Using Uncertainty Estimates

 
 

Part 3 - Analyzing Measurement Decision Risk

Part 3 of the handbook discusses how we use uncertainty estimates, along with other information to develop test and calibration quality metrics that can be useful in making decisions.  Chief among these metrics are false accept and false reject risk. Subtopics are listed below.

 
 

Preliminaries

Probability Relations

Equivalent Accuracy Ratios

  Computing Probabilities

  Including Process Uncertainties

  Using Guardband Limits

 
 

Part 4 - Analyzing Calibration Intervals

This part of the handbook provides an overview of concepts and methods for estimating and adjusting intervals for measurement and test equipment.

 
 

Periodic Calibration

The Goal of Interval Analysis

Reliability Modeling

   Establishing or Adjusting Intervals

   Statistical Interval Testing

 
 

Part 5 - Controlling Measurement Processes

Part 5 of the handbook discusses the use of statistical process control (SPC) to control measurement processes.

 
 

Preliminaries

Measurement Process SPC

  Control Charts

 
 

The Author

Dr. Howard Castrup has a B.S. degree in Engineering, a PhD in Solid State Electronics and has been developing advanced measurement science techniques and methods for over thirty years. He is one of the founders of uncertainty growth modeling and the originator of statistical measurement process control (SMPC). He is also a major contributor to NASA Reference Publication 1342 and the principal author of the NCSLI Recommended Practice on Calibration Intervals Prior to founding Integrated Sciences Group, Dr. Castrup worked as a Microwave Electronics Instructor, an RF and Microwave Metrology Engineer, Sr. Statistician, Sr. Systems Analyst, and Project Manager.

 

Dr. Castrup is a member of IEEE, Sigma Pi Sigma, AIP, AAPT, and is the chairman of the NCSLI Metrology Practices Committee. He has published numerous technical papers and articles on uncertainty analysis, measurement decision risk analysis, statistical process control, and calibration interval analysis. Click Here for a list of professional accomplishments.

 

 

 

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Page Updated March 23, 2008