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Analytical Metrology Handbook
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Part 1 - Facts and Fallacies Part 1 addresses current facts and fictions relating to uncertainty analysis, risk analysis, interval analysis and SPC for measurement processes. |
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Part 2 - Estimating Measurement Uncertainty This part of the handbook discusses various motivations for estimating measurement uncertainty. Methods for estimating uncertainty are described and a systematic procedure for analyzing measurement uncertainty is presented. Part 2 concludes with a discussion of the various uses for uncertainty estimates. Subtopics are listed below. |
Why Estimate Uncertainty? Uncertainty Analysis Fundamentals Estimating Uncertainty The General Uncertainty Analysis Process |
Expanded Uncertainty Reporting Uncertainty Using Uncertainty Estimates |
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Part 3 - Analyzing Measurement Decision Risk Part 3 of the handbook discusses how we use uncertainty estimates, along with other information to develop test and calibration quality metrics that can be useful in making decisions. Chief among these metrics are false accept and false reject risk. Subtopics are listed below. |
Preliminaries Probability Relations Equivalent Accuracy Ratios |
Computing Probabilities Including Process Uncertainties Using Guardband Limits |
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Part 4 - Analyzing Calibration Intervals This part of the handbook provides an overview of concepts and methods for estimating and adjusting intervals for measurement and test equipment. |
Periodic Calibration The Goal of Interval Analysis Reliability Modeling |
Establishing or Adjusting Intervals Statistical Interval Testing |
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Part 5 - Controlling Measurement Processes Part 5 of the handbook discusses the use of statistical process control (SPC) to control measurement processes. |
Preliminaries Measurement Process SPC |
Control Charts |
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The Author Dr. Howard Castrup has a B.S. degree in Engineering, a PhD in Solid State Electronics and has been developing advanced measurement science techniques and methods for over thirty years. He is one of the founders of uncertainty growth modeling and the originator of statistical measurement process control (SMPC). He is also a major contributor to NASA Reference Publication 1342 and the principal author of the NCSLI Recommended Practice on Calibration Intervals. Prior to founding Integrated Sciences Group, Dr. Castrup worked as a Microwave Electronics Instructor, an RF and Microwave Metrology Engineer, Sr. Statistician, Sr. Systems Analyst, and Project Manager. Dr. Castrup is a member of IEEE, Sigma Pi Sigma, AIP, AAPT, and is the chairman of the NCSLI Metrology Practices Committee. He has published numerous technical papers and articles on uncertainty analysis, measurement decision risk analysis, statistical process control, and calibration interval analysis. Click Here for a list of professional accomplishments.
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Page Updated March 23, 2008